cvedb.io
CVE-2022-25696
HIGH · CVSS 8.4
EPSS exploitation probability: 0%
Published 2022-09-16T06:15:11.180 · Last modified 2026-06-17T04:33:59.543

Summary

Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables

Affected products

qualcomm — apq8053_firmware

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References

This product uses data from the NVD API but is not endorsed or certified by the NVD. Informational only; not professional security advice.