cvedb.io
CVE-2022-35858
HIGH · CVSS 7.8
EPSS exploitation probability: 0%
Published 2022-08-04T20:15:20.013 · Last modified 2026-06-17T04:52:24.657

Summary

The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.

Affected products

samsung — mtower

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References

This product uses data from the NVD API but is not endorsed or certified by the NVD. Informational only; not professional security advice.