cvedb.io
CVE-2024-53023
HIGH · CVSS 7.8
EPSS exploitation probability: 0%
Published 2025-03-03T11:15:13.777 · Last modified 2026-06-17T08:08:04.747

Summary

Memory corruption may occur while accessing a variable during extended back to back tests.

Affected products

qualcomm — ar8035_firmware

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References

This product uses data from the NVD API but is not endorsed or certified by the NVD. Informational only; not professional security advice.