cvedb.io
CVE-2025-21436
HIGH · CVSS 7.8
EPSS exploitation probability: 0%
Published 2025-04-07T11:15:51.970 · Last modified 2026-06-17T08:43:24.787

Summary

Memory corruption may occur while initiating two IOCTL calls simultaneously to create processes from two different threads.

Affected products

qualcomm — fastconnect_7800_firmware

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References

This product uses data from the NVD API but is not endorsed or certified by the NVD. Informational only; not professional security advice.