cvedb.io
CVE-2025-21449
HIGH · CVSS 7.5
EPSS exploitation probability: 0%
Published 2025-07-08T13:15:30.567 · Last modified 2026-06-17T08:43:27.210

Summary

Transient DOS may occur while processing malformed length field in SSID IEs.

Affected products

qualcomm — sm8635p_firmware

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References

This product uses data from the NVD API but is not endorsed or certified by the NVD. Informational only; not professional security advice.